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Static Event
Detection System
As electronic device features decrease in size and become increasingly
sensitive to electrostatic discharge (ESD), it is essential to
re-evaluate these rules of defense and adjust accordingly. A wide range
of component devices have ESD sensitivity prompting a general need to
both improve device protection and develop a simple method to determine
whether ESD has affected device or circuit performance. Identification
of ESD related device failures (immediate and latent) needs to be
developed so that suspect devices and/or modules can be removed and
replaced before the damage impacts system performance in the field.
The objective of this program is to develop a Static Event Detector (SED)
Health Monitoring system that alerts inspectors or equipment operators
to an ESD event that may have inflicted catastrophic damage resulting in
degraded systems performance. A Magneto-Optic Static Event Detector will
be developed compatible with a novel optical reader device to remotely
interrogate individual SEDs strategically placed within an electrostatic
sensitive system and to identify the modules or components potentially
damaged. Confirmation of a static discharge event would trigger special
actions or tests to verify operational integrity of the weapons system
under evaluation. Additional devices and test circuits will be developed
to demonstrate the efficacy of this new Health Monitoring system.
Program Manager: Lee
Patch, (734) 995-4972, leep@ncms.org
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