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Automated Test Equipment - Test Program Set Migration System

Electronics repair facilities continue to support legacy test systems well beyond their life expectancies. The retention of the outdated repair capability jeopardizes weapon system availability. Costs associated with migrating or redeveloping test program set (TPS) software is the primary impediment to replacing legacy test systems. Test software migration costs can approach 20 times the cost of the replacement test system. Technologies are needed that can reduce the cost of test software migration as automated test equipment (ATE) systems become completely unsupportable.

Broad Project Objectives include:

• Minimize recurring cost when migrating TPS to new ATE platforms
• Develop automated methods for extracting test requirements from legacy ATE/TPS
• Develop “Middleware” to generate new TPS on modern systems
• Enable data collection for trend analysis and Knowledge Base

This project was initiated in January 2004, participants include:

• DoD: Warner Robins ALC, Tobyhanna Army Depot, NAVAIR Cherry Point
• Industry: Teradyne and Support Systems Associates, Inc.

Program Manager: Lee Patch, (734) 995-4972, leep@ncms.org